DB Design News Archive
DB Design announces ATOM Handler rotation capability
FREMONT, Sep 1, 2017 - DB Design announces Device Rotation Option for ATOM Handler
New feature allows increased flexibility and reduced cost for test labs.
Fremont, California, September 1, 2017 (eReleases) – DB Design, Inc. today announced that the company’s automated semiconductor test handler, ATOM-ic, now has device rotation capability. The new enhancement option means that virtually any orientation of the handler to the test system can be accommodated. The ability to rotate devices to any angular position precludes the requirement to design test boards with pin 1 in any specific location. Existing test boards can now be utilized more often, resulting in lower cost-of-test. In addition, the rotation option can be added in the field on all handlers purchased after May, 2017.
The ATOM-ic test handler, originally introduced in 2012, has been deployed on test floors worldwide and has proven to be the equipment of choice for those seeking a low-cost, high-performance automation solution to replace hand testing in development, characterization, and thermal testing operations.
“This important addition to the already impressive list of ATOM-ic features is especially important for customers using ATE testers such as those from Teradyne and Advantest” said Mark Stenholm, president of DB Design.
About DB Design:
Since 1989, DB Design has been a world leader in providing automation solutions to the semiconductor, solar energy, medical, and automotive industries. The company designs and manufactures products in Fremont, California and supports customers in North America, Asia, and Europe.